Anchoring of a dye precursor on NiO(001) studied by non-contact atomic force microscopy

• Sara Freund,
• Antoine Hinaut,
• Nathalie Marinakis,
• Edwin C. Constable,
• Ernst Meyer,
• Catherine E. Housecroft and
• Thilo Glatzel

Beilstein J. Nanotechnol. 2018, 9, 242–249, doi:10.3762/bjnano.9.26

• (II) oxide (NiO); non-contact atomic force microscopy; p-type semiconductor; sub-molecular resolution; Introduction Inorganic substrates functionalized with organic molecules are nowadays highly regarded materials for emerging hybrid technologies including molecular electronics, photocatalysts or

• that they are lying flat on the surface in a trans-conformation. Within the limits of our Kelvin probe microscopy setup a charge transfer from NiO to the molecular layer of 0.3 electrons per molecules was observed only in the areas where the molecules are closed packed. Keywords: metal oxide; nickel